Verified Syntheses of Zeolitic Materials

2nd Revised Edition

Conditions for recording of XRD patterns reported in this book

Karl Petter Lillerud
Department of Chemistry
University of Oslo
P.R.1033 Blindem, N-0315 Norway

The X-ray diffraction (XRD) patterns were recorded with a SIEMENS D5000 diffractometer. The diffractometer was equipped with a Ge-focusing primary monochromator giving Cu-Kα radiation (λ = 1.5406 Å), a BROWN 70 mm linear position sensitive detector (PSD) and a 40 position sample changer. The PSD is operated with 8° opening. A variable entrance slit giving a constant 6 x 12 mm exposed area is used.

The reported intensity distribution is for fixed slit geometry. The diffraction patterns are recorded with variable slit, but presented with at the intensity distribution recalculated to simulate fixed slit mode. The intensity scale (ordinant) for all patterns is K-Counts/second.

For comparison with measured diffraction patterns is it important to note that routine measurements are often pefformed with a slit that will expose more than the sample area at low angle. The observed intensities at low angle will therefore be too small compared with these reference patterns and calculated patterns.

In this version of the collection all patterns are scaled to the same absolute intensity. The diffraction patterns are presented in the as measured condition without any background subtraction or smoothing. Some samples contain elements that give raised fluorescence, like Fe and Co. No filter or secondary monochromator has been used to remove this radiation.